Publicaciones en colaboración con investigadores/as de Friedrich Schiller University Jena (22)

2009

  1. Characterization of grain structure in nanocrystalline gadolinium by high-resolution transmission electron microscopy

    Journal of Materials Research, Vol. 24, Núm. 2, pp. 342-346

  2. Epitaxial and polycrystalline CuInS2 layers: Structural metastability and its influence on the photoluminescence

    Thin Solid Films, Vol. 517, Núm. 7, pp. 2248-2251

  3. Exterior surface damage of calcium fluoride outcoupling mirrors for DUV lasers

    Optics Express, Vol. 17, Núm. 10, pp. 8253-8263

2008

  1. Optical and structural properties of LaF3 thin films

    Applied Optics, Vol. 47, Núm. 13

2004

  1. The effect of the signal-to-noise ratio in CBED patterns on the accuracy of lattice parameter determination

    Journal of Electron Microscopy, Vol. 53, Núm. 3, pp. 237-244

  2. The formation of clusters and nanocrystals in Er-implanted hexagonal silicon carbide

    Microscopy and Microanalysis

2003

  1. Considerations on the accuracy of lattice parameters determined from HRTEM images

    Microscopy and Microanalysis

  2. Defects in hexagonal SiC analyzed by molecular dynamics and HRTEM image simulations

    Microscopy and Microanalysis

  3. Enhanced compositional contrast in imaging of nanoprecipitates buried in a defective crystal using a conventional TEM

    Microscopy and Microanalysis, Vol. 9, Núm. 1, pp. 36-41

  4. Epitaxial Culn(1-x)GaxS2 on Si(111): A perfectly lattice-matched system for x≈0.5

    Applied Physics Letters, Vol. 83, Núm. 8, pp. 1563-1565

  5. Lattice parameter measurement by CBED: Accuracy limited by the noise

    Microscopy and Microanalysis

  6. Structural properties of MBE grown Cu(In,Ga)S2 layers on Si

    Journal of Physics and Chemistry of Solids

  7. Z-contrast imaging in a conventional TEM

    Microscopy and Microanalysis

2002

  1. Direct observation of defect-mediated cluster nucleation

    Nature Materials, Vol. 1, Núm. 2, pp. 102-105

2001

  1. Analysis of strain and defect formation in low-dimensional structures in SiC

    Materials Science Forum, Vol. 353-356, pp. 259-262

  2. Evidence for 9R-SiC?

    Microscopy and Microanalysis, Vol. 7, Núm. 4, pp. 368-369

  3. The structure of Si nanocrystals on SiC

    Journal of Electron Microscopy, Vol. 50, Núm. 4, pp. 311-319

2000

  1. Illusion of new polytypes

    Materials Science Forum, Vol. 338

1999

  1. On the peculiarities of bright/dark contrast in HRTEM images of SiC polytypes

    Ultramicroscopy, Vol. 76, Núm. 1-2, pp. 21-37

  2. Origin of threefold periodicity in high-resolution transmission electron microscopy images of thin film cubic SiC

    Microscopy and Microanalysis, Vol. 5, Núm. 6, pp. 420-427