Microscopía electrónica
University of Erlangen-Nuremberg
Erlangen, AlemaniaPublicaciones en colaboración con investigadores/as de University of Erlangen-Nuremberg (1)
1999
-
Transmission electron microscopy investigation of SiC films grown on SiC substrates by solid-source molecular beam epitaxy
Journal of Materials Research, Vol. 14, Núm. 8, pp. 3226-3236