Mikroskopia Elektronikoa
University of Erlangen-Nuremberg
Erlangen, AlemaniaUniversity of Erlangen-Nuremberg-ko ikertzaileekin lankidetzan egindako argitalpenak (1)
1999
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Transmission electron microscopy investigation of SiC films grown on SiC substrates by solid-source molecular beam epitaxy
Journal of Materials Research, Vol. 14, Núm. 8, pp. 3226-3236