Publicaciones en colaboración con investigadores/as de Universidad Autónoma de Madrid (3)

2012

  1. Three-dimensional tomography of single charge inside dielectric materials using electrostatic force microscopy

    Materials Research Society Symposium Proceedings

2011

  1. Contrast inversion in electrostatic force microscopy imaging of trapped charges: Tip-sample distance and dielectric constant dependence

    Nanotechnology, Vol. 22, Núm. 34

  2. Numerical study of the lateral resolution in electrostatic force microscopy for dielectric samples

    Nanotechnology, Vol. 22, Núm. 28