Luis Alejandro Miccio Stefancik-rekin lankidetzan egindako argitalpenak (5)

2014

  1. AFM based dielectric spectroscopy: Extended frequency range through excitation of cantilever higher eigenmodes

    Ultramicroscopy, Vol. 146, pp. 55-61

  2. Dielectric spectroscopy at the nanoscale by atomic force microscopy: A simple model linking materials properties and experimental response

    Journal of Applied Physics, Vol. 115, Núm. 18

2013

  1. Local mechanical and dielectric behavior of the interacting polymer layer in silica nano-particles filled SBR by means of AFM-based methods

    Polymer, Vol. 54, Núm. 18, pp. 4980-4986

  2. Study of the dynamic heterogeneity in poly(ethylene-ran-vinyl acetate) copolymer by using broadband dielectric spectroscopy and electrostatic force microscopy

    Macromolecules, Vol. 46, Núm. 18, pp. 7502-7512

2011

  1. Determining concentration depth profiles in fluorinated networks by means of electric force microscopy

    Journal of Chemical Physics, Vol. 135, Núm. 6