Juan Mari
Collantes
IEEE Computer Society
Washington, Estados UnidosPublicaciones en colaboración con investigadores/as de IEEE Computer Society (2)
2002
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Effects of DUT mismatch on the noise figure characterization: A comparative analysis of two Y-factor techniques
IEEE Transactions on Instrumentation and Measurement, Vol. 51, Núm. 6, pp. 1150-1156
2001
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A dynamical load-cycle charge model for RF power FETs
IEEE Microwave and Wireless Components Letters, Vol. 11, Núm. 7, pp. 296-298