IEEE Computer Society-ko ikertzaileekin lankidetzan egindako argitalpenak (2)

2002

  1. Effects of DUT mismatch on the noise figure characterization: A comparative analysis of two Y-factor techniques

    IEEE Transactions on Instrumentation and Measurement, Vol. 51, Núm. 6, pp. 1150-1156

2001

  1. A dynamical load-cycle charge model for RF power FETs

    IEEE Microwave and Wireless Components Letters, Vol. 11, Núm. 7, pp. 296-298