Microscopía electrónica
AT and T Bell Laboratories
Newark, EE. UU.Publicaciones en colaboración con investigadores/as de AT and T Bell Laboratories (2)
2004
-
The formation of clusters and nanocrystals in Er-implanted hexagonal silicon carbide
Microscopy and Microanalysis
2002
-
Direct observation of defect-mediated cluster nucleation
Nature Materials, Vol. 1, Núm. 2, pp. 102-105