Mikroskopia Elektronikoa
AT and T Bell Laboratories
Newark, EE. UU.AT and T Bell Laboratories-ko ikertzaileekin lankidetzan egindako argitalpenak (2)
2004
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The formation of clusters and nanocrystals in Er-implanted hexagonal silicon carbide
Microscopy and Microanalysis
2002
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Direct observation of defect-mediated cluster nucleation
Nature Materials, Vol. 1, Núm. 2, pp. 102-105