Nanooptika
Institute for Theoretical and Experimental Physics
Moscú, RusiaInstitute for Theoretical and Experimental Physics-ko ikertzaileekin lankidetzan egindako argitalpenak (3)
2007
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Simultaneous IR material recognition and conductivity mapping by nanoscale near-field microscopy
Advanced Materials, Vol. 19, Núm. 17, pp. 2209-2212
2006
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Material and doping contrast in semiconductor devices at nanoscale resolution using scattering-type scanning near-field optical microscopy
Conference Proceedings from the International Symposium for Testing and Failure Analysis
2005
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Consolidating apertureless SNOM
Journal of the Korean Physical Society