Multiple defect interpretation based on Gaussian processes for MFL technology

  1. Wijerathna, B.
  2. Vidal-Calleja, T.
  3. Kodagoda, S.
  4. Zhang, Q.
  5. Miro, J.V.
Actas:
Proceedings of SPIE - The International Society for Optical Engineering

ISSN: 0277-786X

ISBN: 9780819494771

Ano de publicación: 2013

Volume: 8694

Tipo: Achega congreso

DOI: 10.1117/12.2009966 GOOGLE SCHOLAR
Fonte de datos: Scopus