Multiple defect interpretation based on Gaussian processes for MFL technology

  1. Wijerathna, B.
  2. Vidal-Calleja, T.
  3. Kodagoda, S.
  4. Zhang, Q.
  5. Miro, J.V.
Proceedings:
Proceedings of SPIE - The International Society for Optical Engineering

ISSN: 0277-786X

ISBN: 9780819494771

Year of publication: 2013

Volume: 8694

Type: Conference paper

DOI: 10.1117/12.2009966 GOOGLE SCHOLAR
Data source: Scopus