Elemental Identification by Combining Atomic Force Microscopy and Kelvin Probe Force Microscopy

  1. Schulz, F.
  2. Ritala, J.
  3. Krejčí, O.
  4. Seitsonen, A.P.
  5. Foster, A.S.
  6. Liljeroth, P.
Revue:
ACS Nano

ISSN: 1936-086X,  1936-0851

Année de publication: 2018

Volumen: 12

Número: 6

Pages: 5274-5283

Type: Article

DOI: 10.1021/ACSNANO.7B08997 GOOGLE SCHOLAR lock_openAccès ouvert editor
La source de données: Scopus