Elemental Identification by Combining Atomic Force Microscopy and Kelvin Probe Force Microscopy

1. Schulz, F.
2. Ritala, J.
3. Krejčí, O.
4. Seitsonen, A.P.
5. Foster, A.S.
6. Liljeroth, P.

Export

Export

×

MLA

modern-language-association

APA

apa

Chicago

chicago-fullnote-bibliography

Harvard

harvard-cite-them-right

Vancouver

vancouver-author-date

---

RIS BibTex

Export

×

This document cannot be exported because it belongs to another portal.

Full text

lock_openFull text externo

DOI: 10.1021/ACSNANO.7B08997 GOOGLE SCHOLAR lock_openOpen access editor

Data source: Scopus