Chemical imaging of interfaces by sum-frequency generation microscopy: Application to patterned self-assembled monolayers

  1. Kuhnke, K.
  2. Hoffmann, D.M.P.
  3. Wu, X.C.
  4. Bittner, A.M.
  5. Kern, K.
Aldizkaria:
Applied Physics Letters

ISSN: 0003-6951

Argitalpen urtea: 2003

Alea: 83

Zenbakia: 18

Orrialdeak: 3830-3832

Mota: Artikulua

DOI: 10.1063/1.1624465 GOOGLE SCHOLAR

Garapen Iraunkorreko Helburuak

Datuen iturria: Scopus