Chemical imaging of interfaces by sum-frequency generation microscopy: Application to patterned self-assembled monolayers
- Kuhnke, K.
- Hoffmann, D.M.P.
- Wu, X.C.
- Bittner, A.M.
- Kern, K.
ISSN: 0003-6951
Year of publication: 2003
Volume: 83
Issue: 18
Pages: 3830-3832
Type: Article