Near-field microscopy through a SiC superlens

  1. Taubner, T.
  2. Korobkin, D.
  3. Urzhumov, Y.
  4. Shvets, G.
  5. Hillenbrand, R.
Journal:
Science

ISSN: 0036-8075 1095-9203

Year of publication: 2006

Volume: 313

Issue: 5793

Pages: 1595

Type: Article

DOI: 10.1126/SCIENCE.1131025 GOOGLE SCHOLAR