Nanoscale free-carrier profiling of individual semiconductor nanowires by infrared near-field nanoscopy
- Stiegler, J.M.
- Huber, A.J.
- Diedenhofen, S.L.
- Gómez Rivas, J.
- Algra, R.E.
- Bakkers, E.P.A.M.
- Hillenbrand, R.
ISSN: 1530-6984, 1530-6992
Argitalpen urtea: 2010
Alea: 10
Zenbakia: 4
Orrialdeak: 1387-1392
Mota: Artikulua