Nanoscale free-carrier profiling of individual semiconductor nanowires by infrared near-field nanoscopy

1. Stiegler, J.M.
2. Huber, A.J.
3. Diedenhofen, S.L.
4. Gómez Rivas, J.
5. Algra, R.E.
6. Bakkers, E.P.A.M.
7. Hillenbrand, R.