Chemical infiltration during atomic layer deposition: metalation of porphyrins as model substrates

  1. Zhang, L.
  2. Patil, A.J.
  3. Li, L.
  4. Schierhorn, A.
  5. Mann, S.
  6. Gösele, U.
  7. Knez, M.
Journal:
Angewandte Chemie - International Edition

ISSN: 1433-7851

Year of publication: 2009

Volume: 48

Issue: 27

Pages: 4982-4985

Type: Article

DOI: 10.1002/ANIE.200900426 GOOGLE SCHOLAR