Mechanisms of formation of chemical bonding and defect formation at the a-SiO2/BaTiO3 interfaces
- Kimmel, A.V.
- Sushko, P.V.
ISSN: 1361-648X, 0953-8984
Année de publication: 2015
Volumen: 27
Número: 47
Type: Article
Revue:
Journal of Physics Condensed Matter
