Mechanisms of formation of chemical bonding and defect formation at the a-SiO2/BaTiO3 interfaces

  1. Kimmel, A.V.
  2. Sushko, P.V.
Journal:
Journal of Physics Condensed Matter

ISSN: 1361-648X 0953-8984

Year of publication: 2015

Volume: 27

Issue: 47

Type: Article

DOI: 10.1088/0953-8984/27/47/475006 GOOGLE SCHOLAR

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