Development of effective technique for irradiating samples of thin films using the focused ion beam

  1. Kotvitckii, A.
  2. Dubitents, A.
  3. Ermakov, K.
  4. Modin, E.
  5. Pustovalov, E.
  6. Plotnikov, V.
Liburu bilduma:
Advanced Materials Research

ISSN: 1662-8985 1022-6680

ISBN: 9783038352549

Argitalpen urtea: 2014

Alea: 1025-1026

Orrialdeak: 765-769

Mota: Biltzar ekarpena

DOI: 10.4028/WWW.SCIENTIFIC.NET/AMR.1025-1026.765 GOOGLE SCHOLAR