Origin of threefold periodicity in high-resolution transmission electron microscopy images of thin film cubic SiC

  1. Kaiser, U.
  2. Chuvilin, A.
  3. Brown, P.D.
  4. Richter, W.
Aldizkaria:
Microscopy and Microanalysis

ISSN: 1431-9276

Argitalpen urtea: 1999

Alea: 5

Zenbakia: 6

Orrialdeak: 420-427

Mota: Artikulua

DOI: 10.1017/S1431927699990487 GOOGLE SCHOLAR
Datuen iturria: Scopus