Origin of threefold periodicity in high-resolution transmission electron microscopy images of thin film cubic SiC

  1. Kaiser, U.
  2. Chuvilin, A.
  3. Brown, P.D.
  4. Richter, W.
Journal:
Microscopy and Microanalysis

ISSN: 1431-9276

Year of publication: 1999

Volume: 5

Issue: 6

Pages: 420-427

Type: Article

DOI: 10.1017/S1431927699990487 GOOGLE SCHOLAR
Data source: Scopus