The effect of the signal-to-noise ratio in CBED patterns on the accuracy of lattice parameter determination

  1. Chuvilin, A.
  2. Kups, T.
  3. Kaiser, U.
Journal:
Journal of Electron Microscopy

ISSN: 0022-0744

Year of publication: 2004

Volume: 53

Issue: 3

Pages: 237-244

Type: Article

DOI: 10.1093/JMICRO/53.3.237 GOOGLE SCHOLAR
Data source: Scopus