Relationship between nano-architectured Ti1−xCux thin film and electrical resistivity for resistance temperature detectors

  1. Ferreira, A.
  2. Borges, J.
  3. Lopes, C.
  4. Rodrigues, M.S.
  5. Lanceros-Mendez, S.
  6. Vaz, F.
Aldizkaria:
Journal of Materials Science

ISSN: 1573-4803,  0022-2461

Argitalpen urtea: 2017

Alea: 52

Zenbakia: 9

Orrialdeak: 4878-4885

Mota: Artikulua

DOI: 10.1007/S10853-016-0722-X GOOGLE SCHOLAR
Datuen iturria: Scopus