Relationship between nano-architectured Ti1−xCux thin film and electrical resistivity for resistance temperature detectors
- Ferreira, A.
- Borges, J.
- Lopes, C.
- Rodrigues, M.S.
- Lanceros-Mendez, S.
- Vaz, F.
ISSN: 1573-4803, 0022-2461
Year of publication: 2017
Volume: 52
Issue: 9
Pages: 4878-4885
Type: Article