Determination of the nanoscale dielectric constant by means of a double pass method using electrostatic force microscopy

1. Riedel, C.
2. Arinero, R.
3. Tordjeman, Ph.
4. Ramonda, M.
5. Ĺv̂que, G.
6. Schwartz, G.A.
7. De Oteyza, D.G.
8. Alegria, A.
9. Colmenero, J.