Determination of the nanoscale dielectric constant by means of a double pass method using electrostatic force microscopy

  1. Riedel, C.
  2. Arinero, R.
  3. Tordjeman, Ph.
  4. Ramonda, M.
  5. Ĺv̂que, G.
  6. Schwartz, G.A.
  7. De Oteyza, D.G.
  8. Alegria, A.
  9. Colmenero, J.
Journal:
Journal of Applied Physics

ISSN: 0021-8979

Year of publication: 2009

Volume: 106

Issue: 2

Type: Article

DOI: 10.1063/1.3182726 GOOGLE SCHOLAR

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