Determination of the nanoscale dielectric constant by means of a double pass method using electrostatic force microscopy

  1. Riedel, C.
  2. Arinero, R.
  3. Tordjeman, Ph.
  4. Ramonda, M.
  5. Ĺv̂que, G.
  6. Schwartz, G.A.
  7. De Oteyza, D.G.
  8. Alegria, A.
  9. Colmenero, J.
Aldizkaria:
Journal of Applied Physics

ISSN: 0021-8979

Argitalpen urtea: 2009

Alea: 106

Zenbakia: 2

Mota: Artikulua

DOI: 10.1063/1.3182726 GOOGLE SCHOLAR

Garapen Iraunkorreko Helburuak