Broadband nanodielectric spectroscopy by means of amplitude modulation electrostatic force microscopy (AM-EFM)

  1. Schwartz, G.A.
  2. Riedel, C.
  3. Arinero, R.
  4. Tordjeman, P.
  5. Alegría, A.
  6. Colmenero, J.
Revue:
Ultramicroscopy

ISSN: 0304-3991,  1879-2723

Année de publication: 2011

Volumen: 111

Número: 8

Pages: 1366-1369

Type: Article

DOI: 10.1016/J.ULTRAMIC.2011.05.001 GOOGLE SCHOLAR
La source de données: Scopus