Broadband nanodielectric spectroscopy by means of amplitude modulation electrostatic force microscopy (AM-EFM)
- Schwartz, G.A.
- Riedel, C.
- Arinero, R.
- Tordjeman, P.
- Alegría, A.
- Colmenero, J.
ISSN: 0304-3991, 1879-2723
Year of publication: 2011
Volume: 111
Issue: 8
Pages: 1366-1369
Type: Article