Numerical study of the lateral resolution in electrostatic force microscopy for dielectric samples
- Riedel, C.
- Alegría, A.
- Schwartz, G.A.
- Colmenero, J.
- Senz, J.J.
ISSN: 0957-4484, 1361-6528
Year of publication: 2011
Volume: 22
Issue: 28
Type: Article