Determining concentration depth profiles in fluorinated networks by means of electric force microscopy
- Miccio, L.A.
- Kummali, M.M.
- Montemartini, P.E.
- Oyanguren, P.A.
- Schwartz, G.A.
- Alegra, N.
- Colmenero, J.
Aldizkaria:
Journal of Chemical Physics
ISSN: 0021-9606
Argitalpen urtea: 2011
Alea: 135
Zenbakia: 6
Mota: Artikulua