Determining concentration depth profiles in fluorinated networks by means of electric force microscopy

  1. Miccio, L.A.
  2. Kummali, M.M.
  3. Montemartini, P.E.
  4. Oyanguren, P.A.
  5. Schwartz, G.A.
  6. Alegra, N.
  7. Colmenero, J.
Journal:
Journal of Chemical Physics

ISSN: 0021-9606

Year of publication: 2011

Volume: 135

Issue: 6

Type: Article

DOI: 10.1063/1.3624574 GOOGLE SCHOLAR