Determining concentration depth profiles in fluorinated networks by means of electric force microscopy
- Miccio, L.A.
- Kummali, M.M.
- Montemartini, P.E.
- Oyanguren, P.A.
- Schwartz, G.A.
- Alegra, N.
- Colmenero, J.
Revista:
Journal of Chemical Physics
ISSN: 0021-9606
Any de publicació: 2011
Volum: 135
Número: 6
Tipus: Article