Determining concentration depth profiles in fluorinated networks by means of electric force microscopy

  1. Miccio, L.A.
  2. Kummali, M.M.
  3. Montemartini, P.E.
  4. Oyanguren, P.A.
  5. Schwartz, G.A.
  6. Alegra, N.
  7. Colmenero, J.
Revista:
Journal of Chemical Physics

ISSN: 0021-9606

Any de publicació: 2011

Volum: 135

Número: 6

Tipus: Article

DOI: 10.1063/1.3624574 GOOGLE SCHOLAR