Three-dimensional tomography of single charge inside dielectric materials using electrostatic force microscopy
- Riedel, C.
- Arinero, R.
- Alegria, A.
- Colmenero, J.
- Saenz, J.J.
ISSN: 0272-9172
ISBN: 9781627482325
Année de publication: 2012
Volumen: 1421
Pages: 1-6
Type: Communication dans un congrès