Three-dimensional tomography of single charge inside dielectric materials using electrostatic force microscopy

  1. Riedel, C.
  2. Arinero, R.
  3. Alegria, A.
  4. Colmenero, J.
  5. Saenz, J.J.
Proceedings:
Materials Research Society Symposium Proceedings

ISSN: 0272-9172

ISBN: 9781627482325

Year of publication: 2012

Volume: 1421

Pages: 1-6

Type: Conference paper

DOI: 10.1557/OPL.2012.53 GOOGLE SCHOLAR
Data source: Scopus