Magnetization depth dependence in exchange biased thin films

  1. Morales, R.
  2. Li, Z.-P.
  3. Petracic, O.
  4. Batlle, X.
  5. Schuller, I.K.
  6. Olamit, J.
  7. Liu, K.
Revue:
Applied Physics Letters

ISSN: 0003-6951

Année de publication: 2006

Volumen: 89

Número: 7

Type: Article

DOI: 10.1063/1.2336742 GOOGLE SCHOLAR