Magnetization depth dependence in exchange biased thin films

  1. Morales, R.
  2. Li, Z.-P.
  3. Petracic, O.
  4. Batlle, X.
  5. Schuller, I.K.
  6. Olamit, J.
  7. Liu, K.
Journal:
Applied Physics Letters

ISSN: 0003-6951

Year of publication: 2006

Volume: 89

Issue: 7

Type: Article

DOI: 10.1063/1.2336742 GOOGLE SCHOLAR
Data source: Scopus