Magnetization depth dependence in exchange biased thin films
- Morales, R.
- Li, Z.-P.
- Petracic, O.
- Batlle, X.
- Schuller, I.K.
- Olamit, J.
- Liu, K.
Aldizkaria:
Applied Physics Letters
ISSN: 0003-6951
Argitalpen urtea: 2006
Alea: 89
Zenbakia: 7
Mota: Artikulua