Juan
Colmenero de León
Centre National de la Recherche Scientifique
París, FranciaPublicacions en col·laboració amb investigadors/es de Centre National de la Recherche Scientifique (6)
2011
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Contrast inversion in electrostatic force microscopy imaging of trapped charges: Tip-sample distance and dielectric constant dependence
Nanotechnology, Vol. 22, Núm. 34
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On the use of electrostatic force microscopy as a quantitative subsurface characterization technique: A numerical study
Applied Physics Letters, Vol. 99, Núm. 2
2010
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Dielectric properties of thin insulating layers measured by electrostatic force microscopy
EPJ Applied Physics, Vol. 50, Núm. 1
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Imaging dielectric relaxation in nanostructured polymers by frequency modulation electrostatic force microscopy
Applied Physics Letters, Vol. 96, Núm. 21
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Nanodielectric mapping of a model polystyrene-poly(vinyl acetate) blend by electrostatic force microscopy
Physical Review E - Statistical, Nonlinear, and Soft Matter Physics, Vol. 81, Núm. 1
2009
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Determination of the nanoscale dielectric constant by means of a double pass method using electrostatic force microscopy
Journal of Applied Physics, Vol. 106, Núm. 2