Université de Toulouse-ko ikertzaileekin lankidetzan egindako argitalpenak (7)

2011

  1. Broadband nanodielectric spectroscopy by means of amplitude modulation electrostatic force microscopy (AM-EFM)

    Ultramicroscopy, Vol. 111, Núm. 8, pp. 1366-1369

2010

  1. Dielectric properties of thin insulating layers measured by electrostatic force microscopy

    EPJ Applied Physics, Vol. 50, Núm. 1

  2. High and low molecular weight crossovers in the longest relaxation time dependence of linear cis-1,4 polyisoprene by dielectric relaxations

    Rheologica Acta, Vol. 49, Núm. 5, pp. 507-512

  3. Imaging dielectric relaxation in nanostructured polymers by frequency modulation electrostatic force microscopy

    Applied Physics Letters, Vol. 96, Núm. 21

  4. Nanodielectric mapping of a model polystyrene-poly(vinyl acetate) blend by electrostatic force microscopy

    Physical Review E - Statistical, Nonlinear, and Soft Matter Physics, Vol. 81, Núm. 1

2009

  1. Determination of the nanoscale dielectric constant by means of a double pass method using electrostatic force microscopy

    Journal of Applied Physics, Vol. 106, Núm. 2

  2. Rouse-model-based description of the dielectric relaxation of nonentangled linear 1,4-cis-polyisoprene

    Macromolecules, Vol. 42, Núm. 21, pp. 8492-8499