Dimas García de Oteyza-rekin lankidetzan egindako argitalpenak (2)

2010

  1. Dielectric properties of thin insulating layers measured by electrostatic force microscopy

    EPJ Applied Physics, Vol. 50, Núm. 1

2009

  1. Determination of the nanoscale dielectric constant by means of a double pass method using electrostatic force microscopy

    Journal of Applied Physics, Vol. 106, Núm. 2