Publicaciones en colaboración con investigadores/as de Universidad del País Vasco/Euskal Herriko Unibertsitatea (99)

2024

  1. AXI Lite Redundant On-Chip Bus Interconnect for High Reliability Systems

    IEEE Transactions on Reliability, Vol. 73, Núm. 1, pp. 602-607

  2. Frente a la moda de la enseñanza en subgrupos pequeños, el potencial del aprendizaje individual

    XVI Congreso de Tecnología, Aprendizaje y Enseñanza de la Electrónica (TAEE 2024). Libro de actas: XVI Conferência em Tecnologia, Aprendizagem e Ensino da Eletrónica (TAEE 2024). Livro de atas.XVI International Conference of Technology, Learning and Teaching of Electronics (TAEE 2024). Proceedings book

2023

  1. Time-Sensitive Networking to meet Hard-real Time Boundaries on Edge Intelligence Applications

    2023 38th Conference on Design of Circuits and Integrated Systems, DCIS 2023

2020

  1. Analysing the interference of Xen hypervisor in the network speed

    2020 35th Conference on Design of Circuits and Integrated Systems, DCIS 2020

  2. Analysing the interference of Xen hypervisor in the network speed

    2020 XXXV CONFERENCE ON DESIGN OF CIRCUITS AND INTEGRATED SYSTEMS (DCIS)

  3. Electronic control board for student Rocket

    2020 35th Conference on Design of Circuits and Integrated Systems, DCIS 2020

  4. Secure Critical Traffic of the Electric Sector over Time-Sensitive Networking

    2020 35th Conference on Design of Circuits and Integrated Systems, DCIS 2020

2019

  1. Fast and efficient FPGA prototype system for embedded control algorithms in electric traction

    2019 34th Conference on Design of Circuits and Integrated Systems, DCIS 2019

  2. Smart Sensor: SoC Architecture for the Industrial Internet of Things

    IEEE Internet of Things Journal, Vol. 6, Núm. 4, pp. 6567-6577

2018

  1. CPPS Gateway - Implementation of Modbus and Profibus on a SoC programmable platform

    IEEE Latin America Transactions, Vol. 16, Núm. 2, pp. 335-341

  2. SEU emulation in industrial SoCs combining microprocessor and FPGA

    Reliability Engineering and System Safety, Vol. 170, pp. 53-63