Mikroskopia Elektronikoa
University of Cape Town
Rondebosch, SudáfricaUniversity of Cape Town-ko ikertzaileekin lankidetzan egindako argitalpenak (1)
2013
-
Interfacial and network characteristics of silicon nanoparticle layers used in printed electronics
Japanese Journal of Applied Physics, Vol. 52, Núm. 5 PART 2