Potential screening effects from support films in electron microscopy

  1. Echenique, P.M.
  2. Vinas, J.
  3. Howie, A.
  4. Ritchie, R.H.
Aldizkaria:
Journal of Physics D: Applied Physics

ISSN: 0022-3727

Argitalpen urtea: 1980

Alea: 13

Zenbakia: 7

Mota: Artikulua

DOI: 10.1088/0022-3727/13/7/002 GOOGLE SCHOLAR