A study on the three key concepts of White Etching Crack failure mode in its very early stages - Contrast with different testing methods

  1. López-Uruñuela, F.J.
  2. Wang, L.
  3. Fernández, B.
  4. Aguirrebeitia, J.
  5. Pinedo, B.
Aldizkaria:
Wear

ISSN: 0043-1648

Argitalpen urtea: 2023

Alea: 530-531

Mota: Artikulua

DOI: 10.1016/J.WEAR.2023.205044 GOOGLE SCHOLAR

Garapen Iraunkorreko Helburuak

Datuen iturria: Scopus