Bi-Te Thin Film Produced by Ion Beam Sputtering: Impact of Beam Voltage in the Seebeck Coefficient

  1. Pires, A.L.
  2. Cruz, I.F.
  3. Ferreira-Teixeira, S.
  4. Resende, P.M.
  5. Pereira, A.M.
Revue:
Materials Today: Proceedings

ISSN: 2214-7853

Année de publication: 2017

Volumen: 4

Número: 12

Pages: 12383-12390

Type: Communication dans un congrès

DOI: 10.1016/J.MATPR.2017.10.007 GOOGLE SCHOLAR
La source de données: Scopus